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        中茂 Chroma PXI 量测解决方案

        时间:2015-08-12 16:41来源:未知 作者:王必良 点击:
        中茂 Chroma PXI 量测解决方案是一种改良自Compact PCI的工业平台规范(PCI eXtensions for Instrumentation)。传统的Compact PCI平台是将标准计算机内PCI Bus的电气规格扩充为适合在高温多震的工业环境中使用的工业级计算机(IPC),而中茂 Chroma PXI 量测解决方案除
               中茂 Chroma PXI 量测解决方案是一种改良自Compact PCI的工业平台规范(PCI eXtensions for Instrumentation)。传统的Compact PCI平台是将标准计算机内PCI Bus的电气规格扩充为适合在高温多震的工业环境中使用的工业级计算机(IPC),而中茂 Chroma PXI 量测解决方案除了延续Compact PCI平台模块化、开放架构、支持热插拔、坚固耐用的特色外,还具有更高速的网络传送、内建计时、及同步触发的数据撷取传输接口。中茂 Chroma PXI 量测解决方案将这些优点发展于测试仪器及系统上,即使采用不同平台的仪器,也因为兼容的软件与硬件技术而轻易整合至PXI的测试系统中。中茂 Chroma PXI 量测解决方案以模块化卡片取代单机、以机箱取代传统的系统后,不但设备空间大为精简,量测功能的组合更为多样,对于现今电子产品升级迅速、生命周期缩短的变化,也能以其弹性化架构及高效能低成本的优势因应之,目前中茂 Chroma PXI 量测解决方案已经成功的广泛应用在汽车测试、半导体测试、航空及军事设备测试上。长沙艾克赛普仪器设备有限公司是中茂 Chroma 在华中地区授权代理商,可提供样机和相关工程师上门演示沟通,以下是长沙艾克赛普仪器设备有限公司为您介绍中茂 Chroma PXI 量测解决方案的系列产品,如果您有任何问题或者需要相关资料,请随时联系:0731-84284278转801,邮箱:shawn.xiao@hncsw.net。
        PXI 半导体/IC 测试系统
        • Model 36010 可程控逻辑脚位模块
        • 100 MHz programmable pin electronic module designed for charactering and testing digital & mixed-signal IC
        • 100 MHz maximum test rate
        • Scalable architecture to provide up to 64 pins
        • Per Pin TMU, TMU, and level/timing setting
        • 32M vector memory, with scan support
        • Model 36020 直流电源供应模块
        • Programmable DUT power supply in a single slot 3U PXI module
        • 4 Channels in standard PXI 3U/PXIe-Hybird compatible bus type
        • +5/-2V and +10V/-2V force ranges
        • 16-bits VF and 18-bits IM resolution
        • 6 selectable ranges from 5uA to 250mA, with ganged function support
        一般PXI 设备
        • Model 52400 series 高精准电源量测单元
        • Applications: Semiconductor Test / LED Test/ Battery Test / Laser Diode Test / Transistor Test/ RF IC Test.
        • High Source/Measurement Resolution (by Multiple Ranges)
        • Low Output Noise
        • High Programming/Measurement Speed (100k s/S) & Slew Rate
        • Output Profiling by Hardware Sequencer
        • Model 52400e series 高精准电源量测单元
        • Applications: Semiconductor Test / LED Test/ Battery Test / Laser Diode Test / FET Test.
        • PXI Express Peripheral Module (X1 PCI Express Link)
        • 18-bit source/measure resolution (multiple selectable ranges)
        • High measurement speed (100k s/S)
        • Output profiling by hardware sequencer
        • Model 52912/52914 PXI 可程式直流电源供应器
        • Dual Isolated outputs; 0-48VDC/ 0~2A/60W, programmable
        • Choice of DC or AC Input Supply
        • High Speed Instrument Sequencer (HSIS#) functionality
        • Outputs May Be Connected in Parallel or Series
        • Model 52100 series 通用型机箱
        • Accepts both 3U PXI and CompactPCI modules
        • Filtered, forced-air cooling, and Hot swapping power supply
        • Compliant with PXI Specification
        • Optional DC ( 24V/ 48V ) input configuration available
        • Model 52200 series PXI背板
        • Compliant With PXI Specification
        • Accepts Both PXI and CompactPCI (PICMG 2.0 R3.0) 3U Modules
        • 64-Bit PCI BUS On P1 & P2, Supports N-1 BUSMastering I/O Slots. (N : Slots)
        • Model 52906 PXI延伸卡 ( PXI Extension Card )
        • Extend PXI backplane signals, Extend PXI BUS to outside of chassis, easy for inspection
        • 3U 64-bit PXI extension card available for hot swapping PXI card
        • Provide short circuit protection
        • Able to use voltage meter to measure the power consumption of +5V, +3.3V, +12V,-12V and VIO
        • Model cPWR-59100 series 3U 工业电脑用热插拔电源供应器
        • Eurorack-compatible Module Design, Input: 100V ~ 240Vac, 18V ~ 36Vdc
        • Hot-swappable, N+1 Redundant
        • Compliant with PICMG 2.11, and worldwide Safety Approval including UL, CSA, CE Marking
        • Model cPWR-59400 series 6U高度 工业电脑用热插拔电源供应器
        • Eurorack-compatible Module Design, Input: 100V ~ 240Vac
        • Hot-swappable, N+1 Redundant
        • Compliant with PICMG 2.11, and worldwide Safety Approval including UL, CSA, CE Marking
        PXI LED 测试系统
        • Model 58131 OLED 寿命周期测试系统
        • Test for electrical characteristic and brightness
        • Thermoelectric cooler controller function (optional)
        • Advance OLED life time prediction algorithm

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